On Single Stuck-at Fault Test Sets for Relay Switching Circuits

Authors

  • Romanov Dmitrii S, Romanova Elena Yu.

Abstract

In this article following statements based on K.A. Popkov’s results are established. For any Boolean function  there exists an irredundant two-terminal relay switching circuit , that depends on not greater than  variables, admits a single stuck-at fault detection test set of cardinality 4 or less, and realizes a Boolean function  which contains  among its subfunctions. Moreover, for Boolean functions of wide class, the number 4 is a minimal cardinality of a single detection test set for irredundant two-termnal relay switching circuits with a possibility of adding variables. It is also proven that for any Boolean function  there exists an irredundant two-terminal relay switching circuit  that depends on not greater than  variables, admits a single stuck-at fault diagnostic test set of cardinality 8 or less, and realizes a Boolean function  which contains  among its subfunctions.

Published

2020-11-01

Issue

Section

Articles