Effect of Ni(1–x) CoxMn2O4:0 ≤ x ≤ 1 Ceramic Overlay on the Characteristics Ag Thick film Microstripline
The effect of Ni(1–x)CoxMn2O4:0 ≤ x ≤ 1 NTC ceramic, in touch overlay on the X and Ku band transmittance and reflectance characteristics of the Ag thick film microstripline is studied. The overlay decreases the transmittance. The decrease in transmittance is a function of the composition of the overlaid material. The change in phase velocity can be used to predict the dielectric properties of the overlaid material Ceramic material. The composition- dependent effects are observed both in the transmission and reflection mode.