Copper Dopped CdSe Thin Films: Structural Characterziation

Abstract

— Copper Dopped cadmium selenide thin films of different composition (0.1 to 1.0 mol %)
deposited at room temperature by dip coating technique on clean glass substances. All the films have
hexagonal structure, polycrystalline nature. The preferred orientation for all films is (002), some other
orientations, including (101),(110),(112),(202) are also observed in the films.The values of interplanar
distance, dislocation density, microstain, lattice parameter, volume of unit cell, number of crystallites per
unit area and particle size of the copper dopped thin films were measured and their variation with dopant
concentration was studied.
Interplanar distance,intensity,lattice parameter,volume of unit cell and particle size increases upto 0.1
mole % of copper,Microstain,dislocation density and number of crystallite per unit area reduces upto 0.1
mol % of copper amount.