An Image Processing Approach for Measuring the Roughness of the Electroplated Nimo and Nip Nano Crystalline Thin Layer Surfaces

Authors

  • S. Ananthi, R. Marudhachalam, R. Kannan, R. Tamilselvi,T. S. Senthil, P. Devaki

Abstract

The nano structured NiMo and NiP thin films were successfully deposited on the Cu substrate by varying the bath temperature (60 ? C to 80 ? C) at constant current density through electroplating technique. All the coated thin films were subjected to various characterization analyses like SEM – EDS, XRD and surface roughness measurement through image processing methods. In this paper, a new method for detecting the roughness of the surface based on hybrid median based image processing approach is presented. The EDS spectrum reveals the existence of chemical elements in the coated NiMo and NiP thin films. The SEM micrograph clearly reveals that the coated thin films are bright, uniform and crack free surface morphology. The EDS spectrum results clearly reveals the existence of Mo and P in the synthesized thin films. The captured images were analysed by pre-processing technique hybrid median filter and the grey level co-occurrence matrix is used to measure the surface roughness parameters. Based on the histogram of SEM images, the optical roughness of coated NiMo and NiP thin films were analysed in detail. The surface roughness variations in NiMo and NiP thin film surface coated at different bath temperatures were also investigated.

Keywords- NiMo; NiP; Hybrid median filter; surface roughness; grey level.

Published

2020-12-12

Issue

Section

Articles